Adam Jurdi

Interactive Tool

Yield / Chiplet Economics Calculator

Model die yield and chiplet economics from die area, defect density, and wafer parameters, visualized against a live wafer map.

Mode

Compare: Monolithic vs. Chiplet

mm²
defects/cm²
Wafer Diameter

Illustrative estimate (300mm, 5nm-class): override with your own figure.

Results

Yield (Murphy)
90.6%
Dies per Wafer
640
Good Dies per Wafer
580
Cost per Good Die
$29.32

Yield vs. Die Area (Murphy)

0%25%50%75%100%102004006008001000Die Area (mm²)TSMC reticle limit (858)NVIDIA H100 die size (814)100mm² · 90.6%

Wafer Map

Good Defective Edge (partial)

Illustrative: 648 representative dies shown, 587 good.